Semiconductor Electrical Safety Part 2: Developing a Risk-Based Approach to Electrical Safety StdPbc-0718 atomic force microscopy (AFM)

atomic force microscopy (AFM)

SEMI E54-0710 (designation update)

SEMI E80-0299 (Reapproved 0915)

corrosion is not measured directly

The applicable concentration range is 20 to 1000 ppm

Semiconductor Electrical Safety Part 2: Developing a Risk-Based Approach to Electrical Safety StdPbc-0718 atomic force microscopy (AFM)Course Description To protect yourself from shock and electrocution, you must understand electrical hazards in your semiconductor workplace. Take this course to learn about different electrical risk assessments and protective measures that may be implemented. Ideal learners are semiconductor fabrication workers. Course Objectives Identify how NFPS 70E applies to semiconductors fabrication facilities. Select information that must be included in risk